Analysis of electrostatic actuated microbeams
(but no experimental results)

Recent work at  Universit`a di Udine, Italy has explored the effectiveness of current mathematical methods in predicting the mechanical behaviour of electrostatically actuated microbeams for large deflections. However they have no experimental validation to verify thier model!

In this work a cantilever microbeam with length l = 100 µm and thickness t = 0.4 µm has been considered. The material of the beam is polycrystalline silicon, with Young modulus E = 166 GPa and Poisson’s ratio ν = 0.36. The beam is in a vacuum. The large deflection referred to in the work is not immediately obvious, though appears to be 80µm (a vertical deflection  greater than 80% of the beam length) for 1700 volts actuation voltage.

They develop their own alternative approach based on a sequential field coupling (SFC) algorithm, claimed to be more suitable to deal with strongly non-conservative electrostatic loads.


They claim that the solution of an electromechanical coupled problem introduces "remarkable computational complexities, which are increased when geometrical non-linearities due to large microstructure deflections also have to be considered". Their new method based on an SFC approach in which electrostatic loads are gradually applied at each iteration to the deformed shape of the structure. This may be more effective to describe the microbeam behaviour; particulary when the voltage at which instability occurs is also evaluated and post-instability solutions predicted.


March 2004 publication

Reference:-
Large deflections of microbeams under electrostatic loads
A Collenz, F De Bona, A Gugliotta and A Soma`
2004 J. Micromech. Microeng. 14 365-373
http://www.iop.org/EJ/abstract/-alert=1/0960-1317/14/3/008






If you have any questions or want further information,

please contact Professor R.B.Yates at R.Yates@mems.org.uk

©2004 R.B.Yates All rights reserved.